Resumen
This document specifies the metrological characteristics of areal instruments for measuring surface topography. Because surface profiles can be extracted from surface topography images, most of the terms defined in this document can also be applied to profiling measurements.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2019-02Etapa: Norma Internacional en proceso de revisión sistemática [90.20]
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Edición: 1Número de páginas: 21
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Comité Técnico :ISO/TC 213ICS :17.040.20
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