Norme internationale
ISO 24688:2022
Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
Numéro de référence
ISO 24688:2022
ISO 24688:2022
Edition 1
2022-07
2022-07
© ISO 2024
Norme internationale
Résumé
This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).
Informations générales
-
État actuel: PubliéeDate de publication: 2022-07Stade: Norme internationale publiée [60.60]
-
Edition: 1
-
Comité technique :ISO/TC 107/SC 9ICS :25.220.01
- RSS mises à jour
Cycle de vie
Vous avez une question?
Consulter notre FAQ
Service à la clientèle
+41 22 749 08 88
Horaires d’ouverture:
De lundi à vendredi - 09:00-12:00, 14:00-17:00 (UTC+1)