ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
Status: PublishedPublication date: 2005-08
Edition: 1Number of pages: 16
Technical Committee: ISO/TC 201/SC 2 General procedures
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