ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Status: PublishedPublication date: 2011-12
Edition: 1Number of pages: 9
Technical Committee: ISO/TC 201/SC 2 General procedures
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