ISO 18117:2009
2009-03
No disponible en español
Resumen
ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2009-03
Versión corregida (en): 2009-06
Versión corregida (fr): 2009-06Etapa: Norma Internacional para revisar [90.92] -
Edición: 1Número de páginas: 9
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Comité Técnico :ISO/TC 201/SC 2ICS :71.040.40
- RSS actualizaciones
Ciclo de vida
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Ahora
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Será reemplazada por
En desarrolloISO/FDIS 20579-1
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