Reference number
ISO 6342:2003
© ISO 2024
International Standard
ISO 6342:2003
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Edition 2
2003-07
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Published (Edition 2, 2003)
This publication was last reviewed and confirmed in 2021. Therefore this version remains current.

ISO 6342:2003

Language
Format
CHF 42
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Abstract

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

General information

  • Status
     : Published
    Publication date
     : 2003-07
    Stage
    : International Standard confirmed [90.93]
  • Edition
     : 2
    Number of pages
     : 3
  • Technical Committee :
    ISO/TC 171
    ICS :
    37.080 
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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