Abstract
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
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General information
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Status: PublishedPublication date: 2003-07Stage: International Standard confirmed [90.93]
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Edition: 2Number of pages: 3
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Technical Committee :ISO/TC 171ICS :37.080
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Life cycle
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Previously
WithdrawnISO 6342:1993
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