Reference number
ISO 17862:2013
ISO 17862:2013
Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
Edition 1
2013-12
Withdrawn
ISO 17862:2013
60837
Withdrawn (Edition 1, 2013)

Abstract

ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.

General information

  •  : Withdrawn
     : 2013-12
    : Withdrawal of International Standard [95.99]
  •  : 1
     : 25
  • ISO/TC 201/SC 6
    71.040.40 
  • RSS updates

Got a question?

Check out our Help and Support