Reference number
ISO 6342:1993
© ISO 2024
ISO 6342:1993
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Edition 1
1993-08
Withdrawn
Withdrawn (Edition 1, 1993)

Abstract

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

General information

  • Status
     : Withdrawn
    Publication date
     : 1993-08
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 3
  • Technical Committee :
    ISO/TC 171/SC 2
    ICS :
    37.080 
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